Specialized
in System Semiconductor.

NEPES ARK

Status

Plants Certification Status Certificate
Cheongju 2 campus QMS-ISO 9001 VIEW
ANSI/ESD S20.20-2021 VIEW
Cheoungan campus QMS-ISO 9001 VIEW
CC Certification (Common Criteria Site Certification) VIEW
ANSI/ESD S20.20-2021 VIEW

Patents

Number Title of the Invention Certificate
10-2687717 Electronic device for monitoring on performance test of a semiconductor device and method thereof VIEW
10-2687718 Electronic device for monitoring on performance test of a semiconductor device and method thereof VIEW